Mathematical and statistical model, adding up the reference XRD spectrums and using the "Klug & Alexander" fundamental relation.

   * No deconvolution of overlapping peaks.

   * Quantitative analysis of those phases which don't show individual peaks.

   * Simplicity : uses the RIR(*) factor and relative intensities only ; no other cristallographic                              expertise is needed.

   * Polyvalence : applicable with any kind of material.

   * Calculation of the amorphous phase content.

   * Mineralogical composition and scan reconstruction are carried out in less than one second.

   * Visualization of the contribution of each phase to each peak.

Functional features

   * Integration and interaction of the qualitative and quantitative phase analyses.

   * Progressive reconstruction of the scan according to the ongoing phase identification.

   * Statistical characterization of the mineralogical phases of the composition.

   * Validation through chemical analysis (if available).

   * Memorization of all the elements of the analysis for later use.

   * Macro-commands for repetitive analyses and fully automated (by SENTINELLE procedure)       production follow-up.

   * Control and traceability (data stored in a MS Access database).

   * Export of the mineralogical composition to the Company's Information System.

   * Multitask, multi-user(with respect of ICDD licence) and multi-language (English and French for       instance).

(*) RIR=Reference Intensity Ratio