Mathematical and statistical model, adding up
the reference XRD spectrums and using the "Klug & Alexander" fundamental
deconvolution of overlapping peaks.
Quantitative analysis of those phases which don't
show individual peaks.
Simplicity : uses
the RIR(*) factor and relative intensities only ; no other cristallographic expertise is needed.
applicable with any kind of material.
amorphous phase content.
Mineralogical composition and scan reconstruction are carried out in
less than one second.
of the contribution of each phase to each peak.
Integration and interaction of the qualitative and
quantitative phase analyses.
Progressive reconstruction of the scan according to
the ongoing phase identification.
Statistical characterization of the mineralogical
phases of the composition.
Validation through chemical analysis (if available).
Memorization of all the elements of the analysis
for later use.
Macro-commands for repetitive analyses and fully
automated (by SENTINELLE procedure) production follow-up.
Control and traceability (data stored in a MS
Export of the mineralogical composition to the
Company's Information System.
Multitask, multi-user(with respect of ICDD licence)
and multi-language (English and French for instance).
RIR=Reference Intensity Ratio